Erratum: corrigendum: Sub-ångstrom resolution using aberration corrected electron optics
نویسندگان
چکیده
منابع مشابه
Progress in aberration-corrected high-resolution transmission electron microscopy using hardware aberration correction.
The design and construction of a double-hexapole aberration corrector has made it possible to build the prototype of a spherical-aberration corrected transmission electron microscope dedicated to high-resolution imaging on the atomic scale. The corrected instrument, a Philips CM200 FEG ST, has an information limit of better than 0.13 nm, and the spherical aberration can be varied within wide li...
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ژورنال
عنوان ژورنال: Nature
سال: 2002
ISSN: 0028-0836,1476-4687
DOI: 10.1038/nature01058